Service Après Vente
TSUKING IGBT ensures that its product reliability reaches the international first-class level by adopting a unique pressure resistant structure design. TSUKING 650V and 1200V IGBT chips have passed the industry's highest standard of 175 ℃, 1000 hour high-temperature reverse bias (HTRB, HTGB) aging accelerated reliability testing.
| Test Item | Stress Condition | Duration | Sample Size | Failure |
| HTRB | Vce= 480V, Vge= 0V, Tc = 175°C | 168hrs | 77 | 0 |
| 500hrs | 77 | 0 | ||
| 1000hrs | 77 | 0 | ||
| HTGB | Vge= 20V, Vce= 0V, Tc= 175°C | 168hrs | 77 | 0 |
| 500hrs | 77 | 0 | ||
| 1000hrs | 77 | 0 | ||
| AC | 121°C, 29.7 psia,100% RH | 96hrs | 77 | 0 |
| 168hrs | 77 | 0 | ||
| TC | -65/150°C,15 mins Dwell Time | 100cyc | 77 | 0 |
| 500cyc | 77 | 0 | ||
| 1000cyc | 77 | 0 | ||
| HTSL | Ta = 150°C | 168hrs | 77 | 0 |
